Scanning tunneling potentiometry implemented into a multi-tip setup by software
نویسندگان
چکیده
منابع مشابه
Scanning Tunneling Potentiometry of Semiconductor Junctions
A method for performing scanning tunneling potentiometry of semiconductor heterojunctions is described. The method yields a direct measure of the electrostatic potential distribution across the interface, with microscopic resolution. The measurement is accomplished by scanning the probe tip at constant sample-tip separation across the junction, and adjusting the sample-tip voltage to maintain a...
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Direct observation of electric potential and field variation near local scatterers like grain boundaries, triple points and voids in thin platinum films studied by scanning tunneling potentiometry is presented. The field is highest at a void, followed by a triple point and a grain boundary. The local field near a void can even be four orders of magnitude higher than the macroscopic field. This ...
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The technique of scanning tunneling microscopy (STMJ has been used to study the spatial variation of the electric potential on thin film surfaces. Topography and potential distribution of the film surface are measured simultaneously. A lateral voltage gradient is obtained by applying a DC voltage bias to a metal film. With our experimental arrangement potential differences of a few @V can be di...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2015
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.4936079